Experts will present a course on the fundamentals of particle size analysis at next week’s exhibition.
This short course will introduce the basics of particle size analysis to those new to the field.
The emphasis will be on the essentials of laser diffraction and dynamic light scattering (DLS) but other techniques such as sieving, sedimentation and electrozone counting will also be covered.
A question and answer session will conclude the day and allow attendees to discuss their queries with the presenters, including any issues with switching from one particle sizing technique to another.
Laboratory personnel, scientists and graduate students are all likely to benefit from the content and the opportunity to interact with leading experts in the field.
’Fundamentals of Particle Size Analysis with an Emphasis on Light Scattering Techniques’ will take place at Pittcon 2013, Philadelphia, USA (March 17 - 21, 2013).
The course will be delivered by Dr Alan Rawle, Applications Manager and Dr Ulf Nobbmann, GPC/SEC Product Manager - Americas, on 19 March 2013 at 8.30am.
To register, or for further details, please click on the link above.
