Enhanced with elemental mapping and line scan, the proX claims to accelerate process times.
The advanced system identifies different elements in a specimen by using the integrated element identification (EID) software and specially designed EDS detector.
The EID technique analyses X-rays generated in the specimen by the bombardment of electrons from an advanced CeB6 electron source.
The software allows users to identify any hidden elements within a sample via the point-and-shoot functionality. Additionally, the software can be expanded with a combined elemental mapping and line scan option.
Elemental mapping reveals the distribution of elements within the sample. The selected elements can be mapped at a user-specified pixel resolution and acquisition time.
Features overview:
- Imaging module with EDX detector.
- 19” touch screen monitor.
- Diaphragm vacuum pump, power supply.
- Pre-installed pro-suite software and the applications remote UI and element identification.
