Caesium ions from Hiden are designed for SIMS depth profiling, surface physics and surface modification.
Hiden Analytical claims an intense beam of caesium ions is ideally suited to SIMS depth profiling, surface physics and surface modification with its IG5C high-brightness caesium ion gun.
Designed for analysis of electronegative elements and MCs clusters, where M is the element of interest, surface ionisation for the product is by thermally-assisted decomposition. The intuitive PC interface provids automatic thermal management and ion beam diagnostics.
Spot diameter is adjustable from 20 micron up to 80 micron with a current range from 0.1 to 150nA, and the caesium source element is fully user-replaceable, self-aligning and air stable. The interface enables full PC control of all beam focus and beam steering parameters, and also of the integral beam raster providing sweep times down to 64 microseconds.
The gun is configured for differential pumping and typically a turbo-molecular pump is used with pump speed near to 60L/S. Mounting to the user chamber is by a small 2.75 inch/70mm diameter Conflat-type flange, and a manually-adjustable bellows is provided for initial beam alignment.
