Jeol demonstrated its JEM-1400Plus at Microscopy & Microanalysis (M&M) 2013 in Indianapolis, Indiana, last week.
Based on the JEM-1400, the TEM made its debut in the United States at the annual meeting of the Microscopy Society of America.
JEOL and Protochips combined its efforts to showcase the TEM technology alongside the Aduro thermal sample holder.
JEM-1400Plus TEM is designed to feature high resolution/high contrast imaging, outstanding S/TEM analytical performance, elemental mapping with the latest large-area SDD detectors, cryomicroscopy, 3D tomography, and montaging.
Its latest TEM is optimised for biological, polymer, and materials research. High contrast resolution is assured at 0.38nm point-to-point and 0.2nm lattice images.
