Nanolane has launched its Sarfus Mapping stations, label-free analytical instruments for real-time sample characterisation at the nanoscale.
Based on Surface Enhanced Ellipsometric Constrast (SEEC) microscopy, the latest range of tools not only tracks changes at surface but also offers live visualisation with high lateral resolution and thickness measurements (from 0.1 to 300nm).
This provides information for understanding surface phenomena such as molecular interactions, layer morphological changes and biofilms build-up. Complete characterisation of samples can be achieved in just a few seconds.
Sarfus Mapping stations are complete turnkey systems including instrument, software and PC.
Each component has been carefully chosen to ensure the best image quality of samples as well as the highest accuracy of the nanometric measurements (repetability: 0.3nm according ISO standard 17025).
Two levels of instruments are commercialised: Sarfus Mapping LR is ideal for fast and routine analyses in air. Sarfus Mapping HR is the high-grade equipment for advanced research studies in air and in liquid.
Product features:
- Live visualisation of films/objects down to nanoscale.
- Topographic analysis of nanometric films and patterns in air and in liquid.
- Real-time study of molecular adsorption/desorption.
- Kinetics studies of film morphological changes vs. time, T°, pH, [C].
- Visualisation of the nano-objects dispersion.
- Visualisation of vesicles spreading on surface.
