Thermo Scientific’s K-Alpha offers scientists affordable access to advanced technology for studying cutting-edge materials
The XPS spectrometer, an enhancement of the K-Alpha instrument, features PLUS detection technology, which improves count rates and offers better recognition of low concentration components, and faster chemical state resolution. It is suitable for the surface analysis of metals, polymers, fabrics, composites, and many other solids.
“We designed the K-Alpha to give users of all experience levels access to the same performance more advanced scientists and researchers have come to expect,” said Kevin Fairfax, nanoscale materials analysis general manager, Thermo Fisher Scientific.
“We believe this brings research-grade surface analysis to more labs and more users.”
The enhanced features of the K-Alpha spectrometer build upon features including the patented, dual-beam charge compensation system for the analysis and depth profiling of insulating samples such as powders and fibres.
Product features:
- Optional MAGCIS dual-mode ion source, with new technology for profiling soft materials.
- Industry-leading Thermo Scientific Avantage Data System software for instrument control, data acquisition, data processing and interpretation, and creating reports.
- Innovative design that is ideal for labs requiring high throughput and reliability.
