Thermo Scientific has launched the Thermo Scientific K-Alpha for scientists, engineers and production technicians seeking faster surface analysis with research-grade performance.
An enhancement of the K-Alpha, the K-Alpha is designed for the special requirements of a multi-user, x-ray photoelectron spectroscopy (XPS) laboratory.
It features PLUS detection technology, which improves count rates and offers better recognition of low concentration components, and faster chemical state resolution.
Compact in design, it has been designed as a cost-effective method for the surface analysis of metals, polymers, fabrics, composites, and many other solids.
“We designed the K-Alpha to give users of all experience levels access to the same performance more advanced scientists and researchers have come to expect,” said Kevin Fairfax, nanoscale materials analysis general manager, Thermo Fisher Scientific.
“We believe this brings research-grade surface analysis to more labs and more users.”
Product features:
- Patented, dual-beam charge compensation system for the analysis and depth profiling of insulating samples such as powders and fibers.
- An optional MAGCIS dual-mode ion source, with new technology for profiling soft materials.
- Thermo Scientific Avantage Data System software for instrument control, data acquisition, data processing and interpretation, and creating reports.
- Innovative design suitable for labs requiring high throughput and reliability.
