Mettler Toledo has announced that the next-generation inline particle vision and measurement (PVM) tool, ParticleView V19 with PVM technology, is now available.
The in situ probe-based particle vision and measurement tool continuously captures high-resolution images under a wide range of process conditions.
ParticleView V19 automatically prepares a report pairing the most relevant images to data tracking particle size and concentration changes.
This blend of high resolution images and trend data helps promote quick, comprehensive particle system understanding for significant productivity enhancements during process design, scale-up, and manufacturing, the company said.
The system’s ability to pair relevant images with trend data means a reduction in the time and effort required to investigate significant process events or upsets.
As scientists are able to readily determine the influence of process conditions on particle size and shape, processes can then be designed so particles behave more predictably.
Scientists can also eliminate the need for cumbersome and sometimes inaccurate offline sampling.
Common applications for V19 with PVM technology include understanding crystallisation; identifying growth, agglomeration, breakage and shape changes; controlling particle size and shape; monitoring polymorphic transitions; identifying the source of batch-to-batch inconsistencies; optimising oil/water separations; and viewing particle and droplet systems in locations where offline sampling is not feasible.
