Analytical techniques and their application in Particle Charaterisation will be presented by one of Malvern Instruments’ product development managers at IFPAC later this month.
Alon Vaisman, product development manager for Process Systems, will discuss the ‘Applications of Dynamic Light Scattering as PAT for on-line nano-particle characterisation’ and ‘In-situ monitoring of high shear and fluid bed processing using spatial filter velocimetry’ during separate presentations at the International Forum on Process Analytical Technology and Quality by Design, due to be held at Arlington, VA, USA from Jan 25 - 28.
The continuing importance of large molecule based therapeutics, and the drive to reduce the particulate size of small molecule APIs, is bringing new challenges for in-process particle characterisation.
Automation of Dynamic Light Scattering (DLS) measurements, and the use of this technology as a process analytical tool, are supporting advances in process development and manufacturing control.
‘Applications of Dynamic Light Scattering as PAT for on-line nano-particle characterisation’ will include examples of the application of on-line DLS in processes such as nano-milling and emulsification.
Considering the opposite end of the particle size spectrum, ‘In-situ monitoring of high shear and fluid bed processing using spatial filter velocimetry’ reviews the implementation of spatial filter velocimetry-based PAT tools for in-situ particle size analysis within fluidised bed and high shear granulation processes during pharmaceutical production.
Examples of the application of the technique to monitoring coating layer thickness and detecting agglomeration during Wurster coating will also be discussed.
