JEOL’s JSM-IT100 is the latest addition to its InTouchScope series of Scanning Electron Microscopes (SEM).
The IT100 is a simple-to-use, versatile, research-grade SEM with a compact ergonomic design.
Featuring expanded energy dispersive spectroscopy (EDS) analysis capabilities and ports for multiple detectors, the InTouchScope can be configured to meet individual lab requirements.
It offers high resolution imaging and a range of acceleration voltages at both high and low vacuum modes.
The IT100 is an intuitive, high throughput microscope designed to streamline workflow in any laboratory.
Touchscreen operation, or traditional keyboard and mouse interface can be used, and fast data acquisition simplifies imaging and analysis of samples.
With the IT100, a user can obtain high quality images using both Secondary Electron and Backscatter Imaging.
The embedded JEOL EDS system with silicon drift detector technology now includes Spectral Mapping, Multi-Point Analysis, Automatic Drift Compensation, Partial area, Line Scan, and Mapping Filter functions.
JEOL’s InTouchScope series includes the NeoScope benchtop SEM with selectable HV/LV and the JSM-IT300LV with advanced analytical capabilities and imaging of large, intact samples.
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