Tests photodiode responsivity across wavelength and has unparalleled speed and accuracy in polarisation dependent responsivity (PDR) measurement
DBM Optics announces its new model 280 photodiode test system. This system allows suppliers of PIN and APD photodiodes to characterise the parametric performance of their components in R and D, QA and production.
The system is very accurate, fast and inexpensive.
DBM says it tests photodiode responsivity across wavelength and has unparalleled speed and accuracy in polarisation dependent responsivity (PDR) measurement.
The 280 system supports both the traditional all-states PDR and the faster, more accurate four-state and six-state PDR measurement methods.
The 280 system implements real-time referencing, a technique developed for DBM Optics's component spectrum analyser and applied here to the photodiode characterisation. Real-time referencing eliminates many of the errors that have plagued responsivity measurement (especially polarisation dependent responsivity).
The 280 can test one photodiode or hundreds of photodiodes in one system.
Measurement noise is very low (below 200fA).
This low noise level allows for very accurate dark current characterisation, which is essential in making accurate measurements of this kind.
Settable 0-10V bias voltage from generation is built-in, thus eliminating the need for separate sourcing and measurement - saving additional time and cost.
A complete characterisation of a photodiode (including responsivity and polarisation dependency over wavelength) is accomplished in less than eight seconds, making this measurement the fastest of its kind, says DBM.
