Jobin Yvon says that a recent report shows excellent reproducibility of depth profile analysis is offered by glow discharge optical emission spectrometry
The GD-Profiler series RF glow discharge OES Instruments from Jobin Yvon can characterise multiple layer conducting and non-conducting coatings.
Applications such as semiconductors, glasses and metals are ideally suited to the instrument's capabilities.
Fast acquisition times enable high throughput analysis while maintaining high reproducibility.
For instance a 360nm thick oxide film on aluminium may be analysed in typically 13 seconds, with in-depth resolution at the nm level and reproducibility of better than 1% for sequential analysis.
A recent publication reports that the glow discharge system from GD-Profiler exhibits excellent reproducibility from run to run. Therefore, the instrument is an ideal tool for on-site quality control of surface related industrial products and coated materials, particularly for thicknesses from a few nanometres to hundreds of microns.
