Features an RF system that can operate in a pulse mode as well as the standard mode, offering major improvements for thin and fragile samples like glass and polymers
Jobin Yvon introduces new improvements in the GD-Profiler series RF glow discharge optical emission spectrometers for bulk, depth profile and surface analysis.
This new system features an ultra fast acquisition module allowing the measurement of layers less than 1nm in thickness.
In addition, it features the TimePlus function - an automatic extension of the measurement during surface analysis if the pre-selected time is too short.
The GD-Profiler now also features an RF system that can operate in a pulse mode as well as the standard mode, offering major improvements for thin and fragile samples for example glasses, polymers etc Samples for GD are generally flat, but an accessory has been developed for the GD-Profiler to allow the analysis of tubes, round or odd sample geometries.
Also a combination of anode diameters from 1 to 7mm is now available.
The patented CentreLite system provides precise positioning of the sample in front of the anode.
The GD-Profiler offers the unique combination of a high resolution polychromator with HDD channels, and a very high resolution monochromator with image function for the simultaneous detection of any additional channel.
In addition, the monochromator offers the measurement of the full emission spectrum.
Finally, the GD-Profiler is equipped with new Quantum XP which offers several unique features including databases for sputtering rates, molecular and line spectra, 3D results display, and the new layer mode for the ultimate precision in the calibration for surface and depth profile analysis.
