First-of-its-kind instrument provides critical information to determine shape, structure, and size distribution of sub-micron materials through advanced optical technologies
Spectra-Physics introduces a new instrument for nano particle research and testing - the Triple-S Oriel fine particle analyser - that provides scientists and engineers with critical information about sub-micron materials through advanced optical technologies.
The compact benchtop unit measures the size, shape, and structure of particles from 50nm to 2µm by employing a patent-pending method of particle characterisation based on elliptically polarised light scattering.
This innovative approach allows users to distinguish between single particles and agglomerates, and to quantify agglomerate structure.
Going beyond the simple, effective sphere size-distribution measurements, more significant shape and structure measurements are made possible, for the first time, in the nano particle size range.
Particles can be classified into a number of shape families, which currently include spheres; ellipsoids; cylinders; and fractal agglomerates.
The analyser measures dimensional information pertinent to the shape, such as diameter and aspect ratio of an ellipsoid particle or fractal dimension and number of monomers in an agglomerate.
Unlike electron microscope techniques, the Triple-S Oriel fine particle analyser works with standard types of dispersions and does not require special sample handling. Particle structure is thus preserved and, for example, particle size and shape aging effects can be identified as either related to agglomeration or crystal-growth processes.
Application areas that will benefit from this advancement in nano particle analysis are pharmaceuticals, colloidal suspensions and dispersions, ceramics research, and design of advanced materials.
