Optical emission spectrometer with inductively coupled plasma excitation (ICP-OES) records the entire spectrum between 175 and 777nm, enabling the simultaneous determination of more than 70 elements
Spectro Analytical Instruments will introduce the new Spectro Genesis SOP (side-on-plasma) with radial plasma observation at the Pittcon 2006 conference on 13 March 2006.
The optical emission spectrometer with inductively coupled plasma excitation (ICP-OES) records the entire spectrum between 175 and 777nm, enabling the simultaneous determination of more than 70 elements.
Based on similar technology as the Spectro Genesis EOP introduced in 2005, the Spectro Genesis SOP utilises an alternative transfer optic with radial observation of the plasma.
"The observation volume is smaller for radial observation of the plasma," explains Olaf Schulz, product manager for ICP at Spectro.
"The detection limits are not quite as low as for the EOP model of the instrument, but it makes up for this with a larger matrix tolerance: the instrument is much more precise for medium to high contents - from the lower ppm to the percent range".
The Spectro Genesis SOP is designed to meet the requirements of industrial users.
Typical applications include the examination of industrial waste water, the analysis of wear metals and additives in oils, and examination of soils and sludge in the agricultural industry.
The instrument also can be used within the chemical industry to examine saline solutions or organic samples, for which axial plasma observation would not deliver satisfying results.
Also currently available are the first packet of methods for use with the Spectro Genesis SOP.
"The Spectro Genesis SOP provides an excellent alternative for industrial laboratories that, until now, have performed analyses with the flame atomic absorption (FAA) technology," notes Tom Milner, marketing manager for Spectro.
"Although the systems are comparably priced, the Genesis SOP simultaneously records the entire spectrum; making it much more efficient, and, in contrast to an FAA instrument, can be run attended without risk".
The Spectro Genesis EOP, introduced at the Pittcon 2005 conference, is an ICP OES that utilises the patented optical plasma interface (OPI) for axial observation of the plasma.
The Spectro Genesis EOP reliably analyses even the lowest of contents in the ppb range.
The instrument is ideally suited for the field of environmental analysis; spefically the determination as to whether or not limits for toxic elements have been exceeded or to conduct analyses of those elements.
Spectro is one of the worldwide leading suppliers of analytical instruments for optical emission and X-ray fluorescence spectrometry.
As a division of the Ametek group, Spectro manufactures advanced instruments for strongly varying applications and provides exemplary customer service.
