PerkinElmer's new Spectrum Spotlight system is dsecribed as a breakthrough in IR chemical imaging technology, setting new standards for performance and speed in the laboratory
Whether the sample is a polymeric packaging material, a tissue section, or a semi-conductor device, Spotlight minimises the cost of problem solving, improves product quality and reduces time-to-market of new products.
With a patented Dual Mode Detector (Duet), specifically built for spectroscopy, Spotlight offers both fast IR imaging and single-point IR microscopy analysis.
Current IR imaging technology limits useable performance down to 1000cm -1 whereas the Spotlight will collect imaging data down to 720cm-1 or 600cm-1 in single-point mode. Variable image sizes may be measured with a resolution down to 6.25 microns.
Spotlight uses 'rapid-scan' instrumentation, to remove the need for expensive, more complex and hence more problematic 'Step-scan' instruments, while dramatically improving analysis time.
Whole images can be collected in a few minutes and advanced display graphics can display the most important results from the analysis in seconds. Fully automated for simplified set-up and data collection, Spotlight is ideal for product defect investigation, impurity identification, product performance testing and in-development formulation testing.
Spotlight's ability to overlay different chemical component distribution images from across the sample is particularly valuable for these applications, Spotlight generates a wealth of chemical information, perfectly complementing data from other imaging techniques, including scanning electron microscopy (SEM) and atomic force microscopy (AFM).
