The LN2 free XFlash 4010 features 125 eV energy resolution at over 100,000 counts per second, making it the highest resolution X-ray spectroscopy and microanalysis detector available
Bruker AXS says it has raised the bar once again with the introduction of a new high resolution silicon drift detector (SDD).
As part of the Quantax microanalysis system, the XFlash 4010 is up to ten times faster than conventional Si(Li) detectors, while delivering excellent energy resolution at any count rate.
Possessing a maximum count rate capability of more than 250,000cps, the detector provides unmatched acquisition speed.
The XFlash 4010 also makes real time spectroscopy for instant element preview possible and enables precise light element analysis.
Featuring a Peltier-cooled SD element, the XFlash 4010 does not require liquid nitrogen for cooling, and is ready for use immediately after being switched on.
And because it has no moving parts and requires no external cooling, the XFlash 4010 operates absolutely vibration free avoiding any disturbance of the image acquisition at the SEM.
All of this is enclosed in a small, compact package that allows the XFlash SDD to fit in areas that would be impossible with a LN2-cooled Si(Li) detector.
Bruker AXS is a developer and provider of life science, materials research and industrial X-ray analysis tools.
