John Morris has introduced the Analysette 22, Fritsch's high resolution laser particle sizer.
The Analysette 22 features an optical measuring cell that allows greater sample resolution.
It allows the user to set a narrow range encompassing the target particle size, then optically zoom in on that area for a greater non-software interpolated result.
The Analysette 22 also allows full measurement range scanning where the end user is still exploring the physical properties of the end product.
There are four models in the range, Compact, Nanotec, Microtec and Microtec XT.
The compact is the standard model, with a measuring range from 0.3 to 300um.
It is ideal for users needing a bench-top instrument for routine particle size analysis.
The Nanotec takes backward scattering into consideration.
Its lowest measurement limit is 0.01um.
The total measurement range from 0.01 - 1000um can be switched to 15 - 2000um through beam expansion.
The zoom function resolves the particle distribution of a sample in up to 520 measurement channels.
The Microtec has a smaller measuring range than the Nanotec.
Because the backward scattering is not captured, the lower measurement limit is 0.1um.
The upper measurement limit of 600um permits the use of a shorter optical bench, resulting in a compact design.
The Microtec XT has a larger upper measuring range than the previous model of 2000um.
For particle characterisation, both the size distribution and shape parameter can be identified.
The Analysette 22 can obtain a particle size distribution and particle shape analysis in a single measurement.
