The QDI 2010 Film from Craic Technologies is now available from Elliot Scientific.
The measurement of thin-film thicknesses on semiconductors, flat-panel displays, micro electro-mechanical systems (MEMS) and other devices in a production environment is now a common requirement for quality control.
To service these needs, Elliot Scientific is offering the QDI 2010 Film microspectrophotometer to manufacturers and researchers in the UK and Ireland.
The QDI 2010 Film is a specialised instrument developed from the existing QDI 2010 UV-VIS-NIR microspectrophotometer, which combines UV microscopy and microspectroscopy in a single tool.
The device can measure the thickness of thin films covering submicron or larger sampling areas by either transmission or reflectance in a rapid and non-destructive fashion.
Using advanced microspectroscopy in conjunction with sophisticated software, the QDI 2010 Film can analyse the film on both transparent and opaque substrates.
Data analysis and recording is provided as standard, with the supplied processing routines suitable for use in a range of applications.
If users' requirements differ, the routines can be modified to suit.
Single and stacked films (up to four) can be measured down to a thickness of just a few nanometres.
