Hitachi High-Technologies has announced that it will be introducing new techniques in SEM, STEM, TEM and FIB at EMAG 2009.
Dedicated TEM applications development staff and SEM design engineers, in addition to UK applications staff, will be on-hand to answer questions and listen to customer ideas regarding the future of electron microscopy.
The latest advances in atomically resolved imaging and EELS with cold field emission Cs-corrected STEM will be presented during the conference proceedings.
The practical considerations of the operation and stability of Cs-corrected instruments will be considered and Hitachi's developments to make atomically resolved data more routinely available will be discussed.
The modular HD-2700 STEM platform provides flexibility for imaging and analysis, available in Cs-corrected and non-corrected configurations as well as with Schottky emission and cold field emission electron sources.
In-situ TEM and double-biprism holography data from the company's 300kV TEM platforms will also be available.
Additionally, Hitachi has developed methods for tomographic reconstruction - the new topography based reconstruction (TBR) brings new standards of precision compared with conventional WBP and SIRT, and ensure more effective visualisation of the 3D structures.
For SEM, the introduction of high sensitivity dual in-lens detection systems, coupled with low-voltage performance from the CFE gun, make the S-5500 and SU-8000 the pinnacle of high-performance SEM.
Highly sensitive electron detection at ultra-low beam energies and flexible high-contrast transmitted electron imaging (BF/DF/HAADF) make these instruments the ultimate tools for investigating challenging and beam-sensitive nanomaterials.
The technologies bridge the gap between SEM, TEM and even traditional surface science techniques, enabling new properties to be investigated.
Also on show will be the versatile TM-1000 tabletop microscope.
Equipped with 3D measurement software, EDX elemental analysis and application-specific stages (heating/cooling, tensile/compression, nano-manipulators, tilt/rotation with IR Chamberscope) the TM-1000 brings flexibility and functionality to a microscopy facility or quality control lab.
