Craic Technologies has announced the QDI 2010 Film microspectrophotometer.
The QDI 2010 Film is designed to measure the thickness of thin films of photovoltaic cells rapidly and non-destructively.
Able to analyse films of many materials on both transparent and opaque substrates, the QDI 2010 Film enables the user to determine thin-film thickness of even microscopic sampling areas.
This tool can be combined with Craic Technologies' contamination imaging capabilities and can even test the transmissivity of PV cell protective covers.
'The QDI 2010 Film microspectrophotometer was built in response to customer requests for a flexible metrology tool that can test a number of different aspects of many different photovoltaic devices,' said Dr Paul Martin, president, Craic Technologies.
The complete QDI 2010 Film solution combines advanced microspectroscopy with software to enable the measurement of film thickness by either transmission or reflectance of many types of materials and substrates.
Sampling areas can range from more than 100 microns across to less than one micron.
Designed for the production environment, it incorporates a number of easily modified metrology recipes, the ability to measure new films and tools for analysing data.
Other features such as contamination analysis and transmissivity testing can be added to the instrument.
