Craic Technologies has announced the QDI 2010 PV microspectrophotometer.
The instrument is designed to measure the transmission and reflectance of photovoltaic cells, whether they be the traditional crystalline silicon, a thin-film variety, super and substrates components or protective glass and concentrator modules.
The QDI 2010 PV also enables the user to determine thin-film thickness of microscopic sampling areas on transparent and opaque substrates.
The tool can be combined with Craic's contamination imaging capabilities to locate and identify process contaminants.
The complete QDI 2010 PV solution combines advanced microspectroscopy with software to enable measurement of transmissivity, reflectivity and luminescence.
It will also be able to determine the thin-film thickness by transmission or reflectance of many types of materials and substrates.
It can also be used to measure the transmissivity and reflectivity from many of the components used to manufacture PV cells, such as concentrators.
Sampling areas can range from over 100um across to less than 1um.
Designed for the production environment, it incorporates a number of easily modified metrology recipes, the ability to measure new films and materials, as well as tools for analysing data.
Other features such as contamination analysis are easily added to the instrument.
