Phenom-World has launched a collection of sample holders and inserts for the Phenom desktop scanning electron microscope (SEM).
The holders increase the range of possible samples, while maintaining the Phenom's time to image.
Quick and easy sample loading ensures faster time to data.
Imaging samples such as paper, polymers, organic materials, ceramics, glass and coatings is said to be fast and trouble free with this sample holder.
With the micro-tool sample holder, it is possible to make high-resolution images from samples such as drills, end-mills, routers, boring bars, engraving tools, needles, fibres, (fuel) injectors and pencils.
This holder enables top-down imaging of samples up to 100mm long.
Samples are loaded into the holder without the need for tools or other preparation.
The micro-electronics insert enables non-destructive imaging of micro-electronics, solar cells and other wafer-based samples.
The clamping mechanism makes glue or other adhesives obsolete, allowing the sample to be mounted quickly and then returned to the production process, or to be used in other quality and failure-analysis machinery.
The X-view insert enables cross-sectional imaging of coatings, multi-layer semiconductors and fracture surfaces.
Preparing the sample is fast and easy compared to resin mounting.
The X-view insert eliminates the need for screws and tools to clamp the sample.
