Craic Technologies has launched the 20/20 Solar microspectrophotometer designed to measure the thickness of thin films as well as the optical efficiencies and clarity of photovoltaic cells.
This can be done by both transmission and reflectance whether the solar cells are the traditional crystalline silicon substrates or one of the thin-film varieties.
Even protective glasses and concentrator modules can be analysed for their efficiency.
The 20/20 Solar can be combined with Craic's contamination imaging capabilities to locate and identify process contaminants.
The complete 20/20 Solar solution combines advanced microspectroscopy with software to enable the user to measure transmissivity, reflectivity and luminescence.
It will also be able to determine the thin-film thickness by either transmission or reflectance of many types of materials and substrates.
It can be used to measure the transmissivity and reflectivity from many of the components used to manufacture PV cells such as concentrators.
Sampling areas can range from more than 100 microns across to less than a micron.
Designed for the production environment, it incorporates a number of easily modified metrology recipes, the ability to measure new films and materials as well as tools for analysing data as well as options for automation including touch-screen control.
Other features such as contamination analysis are easily added to this instrument.
