JPK Instruments has announced the launch of the Nanowizard3 bioscience atomic force microscopy (AFM) system at Microscience 2010.
The core of the system is Hyperdrive - a super-resolution AFM fluid imaging technique.
With low tip-sample interactions, JPK said samples are never damaged.
It is available with the Nanowizard3 AFM head and the Vortis high-bandwidth, low-noise control electronics.
The system is extremely stable to drift and has the ability to detect the smallest cantilever deflections.
The Nanowizard3 Bioscience system design provides high AFM performance in liquids and airs, integrated with optical microscopy.
It comes with good physical and optical access to sample from front and side, even when head and condenser are in place.
The tip-scanning head equipped with a flexure scanner gives high flexibility for a large variety of different samples.
Directoverlay has set the standard for the way AFM and optical microscopy should be combined to provide complementary information from the sample.
Additionally, techniques such as epi-fluorescence, confocal laser scanning microscopy, Tirf, Fret, FCS, Flim, Frap, Storm, Palm, Sted, spinning disc and so on give insight about the behaviour or location of particular sample features.
It is now possible to combine AFM imaging and force measurements with these optical methods on the same spot at the same time on a routine basis.
The advanced AFM head and software modes are said to raise the standard of force spectroscopy measurements with Nanowizard3.
The force Rampdesigner can be used to create custom force curves while the whole experiment and environment can be controlled through the Experimentplanner interface.
This allows convenient and customised force mapping and force ramp/clamp experiments.
