Hitachi has launched the SU1510 variable-pressure scanning electron microscope (SEM) designed to image metals, plastics, composites and foods as well as hydrated samples in the life-sciences sector.
The compact and affordable SEM is 55cm wide and an oil-free, clean turbo-molecular pumping system provides fast pump-down and specimen exchange.
A high-sensitivity BSE detector, combined with Hitachi's Quad-Bias electron beam control, is said to offer superior imaging at low accelerating voltages.
Quad-Bias can increase emission current at low accelerating voltage without changing the probe size or compromising filament lifetime or resolution.
The versatile sample chamber can accept a number of optional accessories, including two EDX detectors simultaneously on opposite sides of the chamber for fast EDX mapping with reduced shadowing effects, cryo systems, EBSD, cathodoluminescence, and variable-pressure secondary electron detectors.
The SEM is said to be easy to operate; 'one-point advice' software helps guide less experienced users to the optimum conditions for the sample and preset conditions can be used for various sample types.
A host of automatic functions help optimise image quality, with a single mouse click to set filament saturation, beam alignment, focus, brightness and contrast.
The variable-pressure mode enables observation of non-conductive or hydrated samples (utilising the optional cool-stage) without the need for sample preparation, such as metal coating.
The optional 3D-View software allows surface roughness, depth and angle measurements to be made and exported, along with the reconstruction of an interactive 3D image of the sample.
