Thermo Fisher Scientific will demonstrate its range of instruments for materials analysis at booth 436 at Microscopy and Microanalysis 2010, from 1-5 August in Portland, US.
During the show, the company will unveil the Thermo Scientific Quasor EBSD for its all-in-one microanalysis solution, Noran System 7.
The system combines electron backscatter diffraction (EBSD) with energy dispersive spectroscopy (EDS) and wavelength dispersive spectroscopy (WDS) capabilities in a single interface.
This is designed to ensure ease of use for new users already familiar with EDS and WDS and enables the simultaneous collection of EBSD, EDS and WDS data.
During the event, Thermo Fisher will demonstrate the ability of the Thermo Scientific Quasor to provide high-speed EBSD mapping to determine the crystal structure of samples in a scanning electron microscope (SEM).
The system allows simultaneous data collection of WDS and EDS spectral images, improved productivity and reporting as data collection, analysis and report generation can be done without switching between programs.
The company will also exhibit the Thermo Scientific K-Alpha, a fully integrated, monochromated small-spot X-ray photoelectron spectrometer (XPS) system and the Thermo Scientific DXR Nanocarbon Microanalysis Package, a set of tools for the rapid characterisation of carbon nanomaterials.
The K-Alpha system delivers a fully automated workflow from sample entry to report generation.
It is designed for a multi-user environment, reduced cost of ownership and increased ease of use and is suitable for surface analysis applications.
The third product on show, the DXR Nanocarbon Microanalysis Package, is a complete system configured for the microcharacterisation of carbon nanomaterials and features the DXR Raman Microscope, as well as software and sampling accessories.
The package incorporates the Thermo Scientific DXR Raman platform and provides information on the molecular structure and morphology of carbon nanotubes, graphene and other nanomaterials.
