FEI has announced the availability of 'An introduction to electron microscopy', a new edition of its primer about electron and ion-beam microscopy.
The booklet can be downloaded for free from FEI's website.
The 40-page booklet is said to be ideal for students and business professionals who would like a view into the world of nanotechnology.
It contains a general overview of electron and ion-beam microscopes, including the history, technology, terminology and applications of transmission electron, scanning electron, scanning transmission electron, focused ion beam and Dualbeam systems.
Image examples cover a variety of samples, such as pollen, semiconductors, steel, minerals, blood cells and viruses.
