Bruker AXS Microanalysis has introduced the E-Flash, a high-performance detector for electron backscatter diffraction (EBSD) analysis on scanning electron microscopes (SEM).
The E-Flash detector has been developed to complement Bruker's EBSD system can for investigation of the microstructure of crystalline samples in SEMs, Quantax Crystalign.
The detector enables the acquisition of 630 patterns per second using 4 x 4 binning.
It is equipped with sensitive high-speed camera and with welded bellows.
It also includes a fully software-controlled motorised high-precision drive providing 240mm travel.
A key feature of E-Flash is the possibility to vary the vertical screen position in situ - in other words, without influencing the vacuum.
Changing the vertical screen position allows for convenient signal optimisation and supports operation at various working distances.
Due to its slim design, the E-Flash provides suitable conditions for simultaneous EDS and EBSD analyses.
The EBSD system Quantax Crystalign is said to guarantee convenient operation through its Signal Assistant, its Calibration Assistant and the integration of all software options under a single user interface.
A range of presentation tools, including SEM images, pattern quality map, phase map, pole figures and inverse pole figures, ensures optimum result visualisation.
The system can be upgraded with a combined backscatter/forescatter electron detector system to provide orientation and Z-contrast similar to classical BSE detectors.
