The new book, 'Scanning Probe Microscopy of Functional Materials,' describes cutting-edge nanoscale imaging and spectroscopy advances in the field of atomic force/scanning probe microscopy.
Edited by Dr Sergei Kalinin of the Oak Ridge National Laboratory and Alexei Gruverman of the University of Nebraska, the scanning probe microscopy (SPM) book features articles by Asylum Research scientists and customers.
The volume includes 18 articles by leading university, US government and industry researchers, including three authored or co-authored by Dr Roger Proksch of Asylum Research, a company specialising in scanning probe/atomic force microscopy (SPM/AFM).
According to Proksch, recent studies have produced remarkable progress in the development of scanning probe microscopy and this new book is expected to become a seminal work in the field.
It includes papers on a broad range of new techniques that extend the functionality of SPMs and provides an overview for readers interested in quickly getting up to speed on the latest developments.
The three chapters authored by Proksch of Asylum Research illustrate some of the new capabilities the company has incorporated into its MFP-3D and Cypher AFMs, including band excitation, dual AC resonance tracking (DART), piezoresponse force microscopy (PFM) and ztherm modulated thermal analysis.
The book is designed to present a snapshot of the most advanced modes of SPM, a continuously evolving technique describing nanoscale studies of a variety of functional materials, such as complex oxides, biopolymers and semiconductors.
