The 20/20 XL UV-visible-NIR microspectrophotometer is designed to non-destructively analyse microscopic features of very large displays, as it is capable of incorporating large-scale sample handling.
With a spectral range from the deep ultraviolet to the near infrared, analysis of samples can be done by absorbance, reflectance, luminescence and fluorescence with high speed and accuracy.
The system can also be configured to image microscopic samples in the UV and NIR regions, in addition to colour imaging.
Due to its flexible design, which gives it the ability to analyse the largest displays, applications are numerous and include mapping colour and intensity variations, film-thickness measurements and scanning the surfaces of display components for defects.
With the ability to spectral analyse and image microscopic features of very large devices, the 20/20 XL microspectrophotometer is suitable for laboratories and manufacturing facilities.
The 20/20 XL microspectrophotometer integrates an advanced spectrophotometer with a sophisticated UV-visible-NIR range microscope and software.
This flexible instrument is designed to attach to large sample-handling frames so that even the largest displays may be analysed.
It is able to acquire data from microscopic features of very large samples by absorbance, reflectance or even luminescence spectroscopy, in addition to microcolorimetry, film-thickness measurements and imaging in the UV, visible and NIR regions.
