Spectro Analytical Instruments has introduced the Spectro Xepos HE XRF instrument, designed for laboratories conducting environmental, geological and waste disposal analysis.
The instrument is optimised for the analysis of medium and heavy elements.
The company claimed it achieves detection limits that are a factor of five to 10 times better than conventional ED-XRF instruments.
Dirk Wissmann, product manager for XRF at Spectro, explained that XRF instruments typically are set up for rapid screening analyses and for the quantification of multiple elements.
They are often used to determine the concentrations of heavy elements only in screening quality, he said.
However, he added, particularly heavy elements, such as cadmium or antimony, are of interest for many applications, which is why the Spectro Xepos HE XRF has been developed.
The Spectro Xepos HE XRF instrument has a flexible excitation source.
It uses an extremely stable end-window tube with a power of 50W.
The instrument also offers a target changer with up to eight polarisation and secondary targets that allows users to achieve sensitivity and accuracy during the analysis of medium and heavy elements.
For these demanding environments, the Xepos HE is equipped with a large-area SDD detector.
This large surface area means the instrument can provide higher sensitivities and gives laboratories the ability to decide whether to measure a great deal faster or achieve lower detection limits.
Spectro Analytical Instruments said the Xepos HE is suitable for geological examinations, compliance analyses for environmental applications, and the analysis of waste oil and alternative fuel.
