The Quantax EDS systems from Bruker Nano are used to provide X-ray microanalysis on scanning electron microscopes and transmission electron microscopes.
The 5000 series LN2-free XFlash silicon drift detectors and the latest-generation Esprit software are claimed to offer excellent performance in qualitative and quantitative energy dispersive microanalysis.
Bruker's 5000 series XFlash detectors display high pulse load capability combined with stable energy resolution.
Their optimised electron trap allows interference-free analysis, even at low excitation energies.
According to the company, the XFlash 5010 detector delivers excellent energy resolution and provides analyses in the low energy range below 1keV.
The detection range spans elements from beryllium to americium.
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