The MFP-3D atomic force microscope offers nanolithography, dual AC, and piezoresponse force microscopy modes.
The system includes closed-loop precision, high-resolution imaging and low-noise force measurements.
Additional functionality is optional for modes such as conductive AFM, AM-FM viscoelastic mapping for nanomechanical analysis, scanning tunnelling microscopy (STM), and scanning thermal microscopy (SThM).
Features overview:
- Temperature and environmental control.
- Acoustic and vibration isolation.
- Electronic response of materials.
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