A whitepaper published by Retsch Technology looks at the advantages and drawbacks of three common particle size analysis techniques, their comparability among each other as well as detailed application examples.
Each method - including dynamic digital image analysis (DIA), static laser light scattering (SLS, also called laser diffraction) and sieve analysis - covers a characteristic size range within which measurement is possible, as shown in figure 1 of the attached whitepaper, and which partly overlap.
The three methods presented, for example, all measure particles in a range from 1 ?m to 3 mm.
However, the results for measuring the same sample can vary considerably.
To find out more, and see the results, please download the PDF above.
