Single analytical technique using inductively coupled plasma mass spectrometer replaces up to three methods to determine major, minor, and trace elements in plants
Agilent Technologies Europe has announced the development of a new approach for the analysis of major, minor, and trace elements in plant materials.
The developed method allows all elements to be determined in a single analysis using the Agilent 7500c inductively coupled plasma mass spectrometer (ICP-MS). Traditionally, up to three different techniques could be required to complete this analysis: inductively coupled plasma optical emission spectrometry (ICP-OES), graphite furnace atomic absorption spectrometry (GFAAS), and hydride generation atomic absorption spectrometry (HG-AAS).
The use of a single analytical technique dramatically improves sample throughput while facilitating data management.
The Octopole Reaction System (ORS) featured in the 7500c ICP-MS virtually eliminates spectral interferences arising from the complex sample matrix that can be problematic on key elements such as iron, chromium, and vanadium. Because the ORS uses only light reaction gases (usually helium) to remove interferences, a passive reaction cell can be used - avoiding the complex method setup and optimisation required with dynamic cells.
A further benefit of the use of helium is that is does not react with the sample matrix components, allowing different sample matrices to be run against a simple aqueous calibration, significantly increasing sample throughput.
For further information, request application note 'Measurement of Macro and Trace Elements in Plant Digests Using the 7500c ICP-MS System', publication number 5988-4450EN.
This note is available without charge from any Agilent sales office or its website (details above).
