Short wavelength infrared system allows researchers to investigate phenomena that would remain unseen with visible cameras, and at a reasonable cost
In providing very clear and sensitive images in the short wavelength infrared spectrum, the new Jade SWIR from Cedip Infrared Systems allows researchers to investigate phenomena that would remain unseen with visible cameras, and at a reasonable cost.
The wavelength gap addressed by the Jade SWIR, 0.8-2.5 microns, allows the camera to see through paint coatings and then reveal hidden blemishes.
Consequently the Jade SWIR will provide aerospace, automotive and engineering researchers with a powerful and fast tool to investigate non-uniformly coated layers or defects in an underlying structure.
Using a thermoelectrically cooled MCT focal plane array sensor the Jade SWIR provides high sensitivity with an increasing response at the longer wavelengths.
By using selected narrow band optical filters, the Jade SWIR may be further fine tuned to provide optimised performance to the sub-band to be analysed.
Operating at up to 100 frames per second at full image size (320Hx256V), with output digitised over a complete 14-bits dynamic range the Jade SWIR provides the leading edge resolution to clarify even the smallest area of defect or non-uniformity.
Coupled with Cedip's PC-based analysis and reporting software the system provides users with a powerful and cost effective investigative tool.
