Technique uses circularly polarised light in contrast to conventional DIC to solve insufficient contrast problems observed in classical brightfield and darkfield microscopy
Carl Zeiss is pleased to introduce innovative circular differential interference contrast (C-DIC) technique.
C-DIC uses circularly polarised light in contrast to conventional DIC to solve insufficient contrast problems observed in classical brightfield and darkfield microscopy.
Fine surface structures can now be observed with high contrast and resolution simultaneously, independent of orientation.
The C-DIC technique provides increased effectiveness for image inspection and analysis in many areas of materials sciences.
The C-DIC prism is inserted into the compensator mount of the microscope.
The prism works independently of sample orientation and used without a rotating stage with only two sliders.
All information about the specimen is rendered visible with sharper contrasts by adjusting the C-DIC prism.
No stage or object rotation is required.
Object orientation and the full information content are retained.
The circularly polarised light ensures homogeneous illumination for improved image contrast with fully opened illumination aperture. Fixed mechanical and scanning stages can be used for higher throughput in defect analysis.
Various system configurations for convenient image analysis are available by combining upright and inverted Zeiss microscopes with the Zeiss AxioCam digital camera and the Zeiss AxioVison software.
