Scanning electron microscope is capable of handling specimens up to 254mm in diameter, 70mm in height, and 2kg in weight
A new variable pressure SEM capable of handling specimens up to 254mm in diameter, 70mm in height, and 2kg in weight has been launched by Hitachi High-Technologies.
The new S-3600N joins the S-3000N and S-3500N in Hitachi's existing range of VPSEMs. Variable pressure technology permits examination of virtually any sample without the need for traditional sample preparation techniques.
The high precision eucentric specimen stage is fully motorised in all five axes and offers movements of 150mm in X, 110mm in Y, 5-50mm in Z, -15 to +70 deg tilt and 360 deg continuously variable rotation.
The ultra-large specimen chamber of the S-3600N features five horizontal and three inclined accessory ports.
This allows the mounting of a comprehensive range of optional analytical detectors, including cathodoluminescence, EBSP and energy dispersive and wavelength dispersive spectrometers.
An optional Environmental Secondary Electron Detector (ESED) is available for secondary electron imaging during variable pressure operation.
The S-3600N offers excellent performance with resolution figures of 3.0nm at 25kV at high vacuum and 4.5nm at 25kV at variable pressure.
These are guaranteed on-site resolution figures.
The new instrument is extremely easy to operate, utilising the Windows NT operating system.
A comprehensive array of automatic functions such as autofocus, autostigmation, autobrightness and autocontrast are provided as standard.
Management of the instrument's digital images is made straightforward with the inclusion of PCI image database software and full energy dispersive X-ray analysis software integration packages are also available.
