Outfitted with four computer-controlled collimators with diameters from 0.1 to 1.0mm, this instrument is suited to analyses ranging from jewellery to archaeology and forensics
Six months after the successful product introduction of the Spectro Midex at Pittcon 2003, Spectro Analytical Instruments now brings to market the Midex M, the newest member of the bench top micro-XRF family, featuring four computer-controlled collimators and extended mapping capabilities.
While the Spectro Midex is delivered with a fixed 0.35 mm diameter collimator, the newest member of the product family is outfitted with four computer-controlled collimators with diameters of 0.1mm, 0.35mm, 0.5mm, and 1.0mm.
This measurement spot size flexibility allows the Midex M to adapt perfectly to match the surface conditions and the size of the sample area to be examined.
As universal analysis instruments, the Midex product family delivers fast, non-destructive analyses for a wide range of elements.
Using the newly developed, and Spectro proprietary, program FP+, analysis accuracy has been improved dramatically compared to 'classic' FP methods.
With the ultra-small measurement spots, in addition to the analysis of jewellery and dental alloys, the instruments are also well suited for archaeological and historical/preservation analysis purposes.
Further applications are found in forensics and criminology, processing industries, as well as for the examination of wear particles in lubricating oils.
In addition to the bulk or particle composition analysis, the instrument can also determine layer thickness quickly, accurately, and reliably.
The measurement time is typically just two to three minutes.
