Significantly improves the detection limits of the quadrupole ICP-MS technique with a further improvement to signal-to-background performance
The new X Series II ICP-MS from Thermo Electron is a major update to the highly successful X Series ICP-MS.
The instrument, said to be the most productive quadrupole ICP-MS for both routine and high performance analytical work, will be exhibited at the European Winter Plasma Conference 2005, Budapest, Hungary, 30 January - 3 February 2005.
Utilising a new ion extraction system, the X Series II significantly improves the detection limits of the quadrupole ICP-MS technique with a further improvement to what is described as already class leading signal-to-background performance.
The X Series II also features a new protective ion extraction ion optics design, which dramatically reduces blank levels and improves the interference removal capabilities in combination with Thermo's new third generation collision cell technology.
A new XT interface, which is featured as standard in the X Series II ICP-MS, utilises the 'groundbreaking' cone geometry and analytical benefits of the previous Xi Interface but improves the matrix tolerance capabilities and reduces user maintenance requirements.
Ensuring maximum ease-of-use and high productivity, the new interface as well as the ion optics design require no user cleaning or replacement of components in the high vacuum area - a benefit unique to Thermo ICP-MS.
The new X Series II ICP-MS presents enhanced benefits across the whole range of common ICP-MS applications.
The ease of use and practical design of the X Series II means that laboratories can achieve their analytical objectives faster, with greater confidence and less hands-on time from the operator, says Thermo.
