The recently-launched S-3400N variable pressure scanning electron microscope from Hitachi High-Technologies has improved display and signal mixing facilities for greater versatility of operation.
In addition to its sophisticated array of automated facilities, the S-3400N features the highly popular GUI first introduced on the S-4800 Fesem.
Facilities include a full screen mode which makes almost the entire screen available for image observation to enable rapid location of features of interest.
A movable small screen display is also provided for image optimisation or local area X-ray scanning.
There is also a new, real-time dual image display to allow images from two different detectors to be displayed simultaneously.
Each image may be adjusted independently and the signals can also be mixed together.
This would allow a combined image to be produced from, for example, secondary electron and backscattered electron detector.
The GUI display is fully configurable for the user to allow display of the essential control functions and also features an animation which shows users how to carry out routine maintenance such as changing a filament.
