Two new application notes for scanning transmission electron microscopy compare the performance of Stem and Tem instruments, and consider microanalysis with nanometre spatial resolution
Following the high level of interest in the HD-2300 scanning transmission electron microscope, Hitachi High-Technologies has added two new publications to its series of electron microscopy application notes.
Application Note 4 is entitled 'Why Stem not Tem', and Application Note 5 is entitled 'Microanalysis with nanometre spatial resolution in the HD-2300 Stem'.
Application Note 4, Why Stem not Tem, compares the performance of the Stem (scanning transmission electron microscope) with Tem (tunnelling electron microscope) and looks in more detail at the different imaging modes of the HD-2300.
These include chromatic aberration-free brightfield imaging of samples up to a few microns thickness, and the unique High Angle Annular Dark Field (HAADF) imaging mode.
HAADF shows contrast due to the mass-thickness or atomic number contrast.
The HD-2300 can also collect secondary electrons and backscattered images in the same way as a standard SEM.
Application Note 5, Microanalysis with nanometre spatial resolution in the HD-2300 Stem, covers the two elemental analytical techniques available for the HD-2300.
These are EDX and electron energy loss spectrometry.
The note highlights the rapid data elemental data acquisition capability, improved EDX sensitivity compared to Tem and the improved spatial resolution in elemental mapping compared to scanning electron microscopy.
