Latest Product Update
Remote microscopy demonstrated at M+M 2008
Jeol USA | Added: 31 Jul 2008
From the exhibition hall in Albuquerque, Jeol USA will demonstrate via remote operation three of it…
Software enhances TEM imaging and data acquisition
Jeol USA | Added: 30 Jul 2008
Jeol will demonstrate a variety of new software packages for its 120kV to 300kV series of transmiss…
Tutorial for practical remote in situ microscopy
Jeol USA | Added: 29 Jul 2008
Jeol USA will host a tutorial session at M+M 2008 in conjunction with Oak Ridge National Laboratory…
Connectivity improves and accelerates TEM Imaging
FEI | Added: 16 Jul 2008
By accelerating and improving the quality of preparation, imaging and analysis of the ultra-thin sa…
Atomic force microscope has large stage
Agilent Technologies Europe | Added: 15 Jul 2008
Agilent has announced the availability of the 5600LS, a high-resolution atomic force microscope tha…
A new category of scanning electron microscopy
FEI | Added: 8 Jul 2008
With its announcement of the Magellan family, FEI says it has introduced a new class of instruments…
Clarion call for more powerful electron microscope
The Royal Microscopical Society | Added: 23 Jun 2008
At Microscience 2008, London, 24-26 June, further developments in this extraordinary new technique …
ETEM for atomic scale chemical research
FEI | Added: 23 Jun 2008
Titan ETEM is intended for chemical research at the atomic scale, and is a significant advance for …
Perfect balance of analyser, detector and software
Thermo Fisher Scientific (Microanalysis) | Added: 6 Jun 2008
Equipped with a high throughput pulse processor, spectral imaging capability and a sophisticated so…
SU6600 is new variable pressure field emission SEM
Hitachi High Technologies | Added: 2 Jun 2008
Hitachi High-Technologies has announced the new SU6600 variable pressure field emission SEM, furthe…
Applications notebook for Accutof-Dart mass spec
Jeol USA | Added: 14 May 2008
Jeol USA has published the fourth edition of its popular collection of applications notes for open …
Hitachi expands its electron microscopy range
Hitachi High Technologies | Added: 23 Apr 2008
Hitachi High-Technologies is introducing two new additions to its rapidly expanding range of electr…
Titan recognised for technical excellence
FEI | Added: 24 Mar 2008
FEI's Titan 80-300, the world's most powerful commercially-available microscope, was given an award…
Particle characterisation gives size and shape
FEI | Added: 4 Mar 2008
FEI and Malvern Instruments have released Quanta Morphologi, combining the performance of FEI's Qua…
Nikon and Jeol launch NeoScope benchtop SEM
Jeol USA | Added: 3 Mar 2008
NeoScope, targeted at the bioscience research and industrial inspection communities, fills the opti…
Tabletop microscope is kinder to the environment
Hitachi High Technologies | Added: 29 Feb 2008
Hitachi High-Technologies says its TM-1000 tabletop microscope is measurably kinder to the environm…
Boeckeler to distribute Jeol sample prep tool
Jeol USA | Added: 22 Feb 2008
Boeckeler's RMC products division of Tucson, Arizona, a manufacturer of microtomes for sample prepa…
Titan Krios opens eyes for structural biology
FEI | Added: 4 Feb 2008
FEI has introduced what it says is a revolutionary, high-throughput, cryo transmission electron mic…
Scanning electron microscope is 'portable'
Jeol USA | Added: 8 Jan 2008
The new CarryScope is described as the ideal instrument for the mobile crime lab where imaging and …
The electron microscope and the moon walker
FEI | Added: 20 Nov 2007
Philadelphia's Central High School became the first in the USA to open deep inner space exploration…
