Latest Product Update
Automated SEM analysis for minerals exploration
FEI | Added: 27 Mar 2007
The combined solution features FEI's Quanta SEM and JKTech's Mineral Liberation Analyzer software a…
Nano-DST: an advanced platform for AFM research
Pacific Nanotechnology | Added: 6 Mar 2007
Pacific Nanotechnology (PNI), having introduced the tabletop Nano-R AFM systems, now brings an adva…
3D nanoscale characterisation and analysis
FEI | Added: 21 Feb 2007
Quanta 3D FEG expands FEI's DualBeam portfolio; high-resolution, low-vacuum SEM/FIB DualBeam delive…
High performance Stem has new electron optics
Hitachi High Technologies | Added: 9 Jan 2007
By reducing the performance-limiting spherical aberration, the HD-2700 offers significantly improve…
New capabilities for scanning electron microscopes
AP Technologies | Added: 4 Jan 2007
AP Technologies announces the new 3Max detector from El-Mul Technologies of Yavne, Israel, describe…
Hitachi contributes to microscopy congress
Hitachi High Technologies | Added: 17 Aug 2006
Representatives will reinforce company's expertise in electron optics by making a significant contr…
Thermo upgrades its X-ray microanalysis system
Thermo Fisher Scientific (Microanalysis) | Added: 2 Aug 2006
Thermo Electron has improved its X-ray microanalysis system, Noran System Six, enabling superior pr…
FEI launches top-of-line research dualbeam at M+M
FEI | Added: 1 Aug 2006
Helios NanoLab features ultra-high resolution field emission SEM column combined with Sidewinder FI…
Large chamber analytical VPSEM launched by Hitachi
Hitachi High Technologies | Added: 13 Jul 2006
S-3700N Variable Pressure scanning electron microscope (VPSEM) has analytical chamber capable of ac…
FEI launches certified tools programme globally
FEI | Added: 11 Jul 2006
FEI has announced the global launch of its Certified Tools programme featuring factory-refurbished …
Grids for mass specs and electron microscopes
Tecan | Added: 3 Jul 2006
Tecan now offers grids for manufacturers and users of time-of-flight mass spectrometers, grids for …
Fei prepares shipments of US team project systems
FEI | Added: 13 Jun 2006
FEI has received US (DoE) contracts for four Titan scanning/transmission electron microscopes (S/Te…
New generation atomic force microscope
Pacific Nanotechnology | Added: 8 Jun 2006
The Nano-R2 is a multipurpose scanning probe microscope for capturing images and making measurement…
Making measurements on the nanometre scale
Pacific Nanotechnology | Added: 23 May 2006
The Nano-R2 is a multipurpose scanning probe microscope for capturing images and making measurement…
New generation of scanning microscopy
Uniscan Instruments | Added: 22 May 2006
Uniscan Instruments has launched a new concept in scanning probe electrochemistry instrumentation w…
Launch leads largest ever instrument showing
Hitachi High Technologies | Added: 20 Apr 2006
Microscience 2006 sees the largest ever showing of electron microscopes by Hitachi at a UK show, in…
LAT brings tabletop microscope to Microscience
Lambda Advanced Technology | Added: 20 Apr 2006
Lambda Advanced Technology (LAT) will be showing the recently announced Hitachi TM-1000 tabletop mi…
Simultaneous topography and recognition in AFM
Molecular Imaging | Added: 19 Apr 2006
Picotrec is world's first simultaneous topography and recognition imaging system for atomic force m…
Tabletop microscope as easy as a digital camera
Hitachi High Technologies | Added: 7 Apr 2006
The new TM-1000 tabletop microscope from Hitachi High-Technologies is set to transform the field of…
New Quantax Quad EDS system shown at Pittcon 2006
Bruker Daltonik GmbH | Added: 27 Mar 2006
At Pittcon 2006, Bruker AXS Microanalysis exhibited its recently announced Quantax Quad ultra-fast …
