Malvern Instruments will play an active role at the 5th World Congress on Particle Technology (23-27 April 2006; Orlando), contributing sessions at the conference and participating in the exhibition
Malvern's conference speakers will include David Higgs, business development manager, who will present a paper entitled 'Using Advances in Communication Tools for the Education of Users of Particle Characterization Instrumentation' in the session on 'Outreach Activities in Particle Technology'.
Alan Rawle, divisional manager - applications support, will speak about 'Refractive index verification via comparative wet and dry laser diffraction measurements' in the 'Particle Size Measurement - I' session.
On display will be the Malvern Zetasizer Nano, now used extensively for the measurement of particle size, stability characterization using zeta potential, and molecular weight - for routine measurements and those at the leading edge of materials research.
These materials range from particle dispersions to emulsions and molecules in solution.
The Zetasizer Nano's unique technology provides the sensitivity required for the measurement of highly dilute proteins and polymers, as well as the ability to measure inks, pigments and emulsions at high concentrations.
It enables particle size measurement over the range 0.6 to 6000nm, molecular weight measurement from 1x10^3 to 2x10^7 Daltons and the zeta potential of particles from 5nm to 10um.
Alongside the Zetasizer Nano will be the new Bohlin Gemini HR nano rheometer - optimized for the control of ultra-low torques, this opens up new opportunities to probe weak or sensitive material structures and low viscosity systems.
Malvern's industry-leading Mastersizer 2000 laser diffraction particle size analyzer for wet and dry analysis will also be on display.
