The Agilent Mac Mode III allows one-pass multi-channel detection for Kelvin force microscopy (KFM) and electric force microscopy (EFM)
Agilent Technologies has introduced the Magnetic AC Mode III (Mac Mode III) controller, which is particularly useful in areas that require high resolution and force sensitivity, such as biology, polymers and surface science.
Built on field-proven technology, this gentle, nondestructive atomic force microscopy (AFM) technique is designed for imaging delicate samples in liquid or air.
"The new set of capabilities provided by Mac Mode III greatly enhances the utility of our nanotechnology measurement instruments, better enabling researchers to customize their experiments," said Jeff Jones, operations manager for Agilent's AFM facility in Chandler, Arizona.
"The introduction of this technology underscores our commitment to meet and exceed the demands of emerging applications".
Mac Mode III offers three user-configurable lock-in amplifiers, affording researchers versatility, higher accuracy and quicker time to results.
It has a wider operating frequency range - up to 6MHz - enabling scientists to investigate higher harmonic modes.
Built-in Q control further enhances the resonance peak.
Higher harmonic imaging provides contrast beyond that seen with fundamental amplitude and phase signals, allowing scientists to collect additional information about mechanical properties of the sample surface.
Simultaneous, high-accuracy topography and surface potential measurements are facilitated by a servo-on-height cantilever approach that is not susceptible to scanner drift.
KFM/EFM offers excellent utility for measuring dielectric films, metal surfaces, piezoelectrics and conductor-insulator transitions.
MAC Mode III can be operated simultaneously with environmental control, temperature control, electrochemical control and controlled fluid exchange.
Agilent's acoustic AC mode is included with MAC Mode III.
AFM Instrumentation from Agilent.
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