The new CarryScope is described as the ideal instrument for the mobile crime lab where imaging and analysis of trace evidence are conducted right at the crime scene
Jeol USA introduces a new mobile scanning electron microscope that can travel or easily be moved to different locations as needed.
In the research or manufacturing setting, the CarryScope can be transported between the lab, conference room, or office for inspection of products or analysis of research samples.
The Jeol CarryScope delivers several high resolution performance imaging and analytical capabilities of conventional electron microscopes, making it easy to observe high and low magnifications of fine surface structures and digitally record images.
Standard features include 8x to 300,000x imaging and up to 5.0nm resolution.
The CarryScope produces a sharp image that makes it possible to conduct and annotate high precision measurements on sub-micron structures.
The optional eucentric motorised specimen stage holds a specimen up to 150mm in diameter.
Other options include Low Vacuum, EDS compatibility, and multiple live image display, including picture in picture.
A stage navigation system and SmileShot software with smart settings for routine imaging further enhance the capabilities of this small footprint SEM.
Not exactly pocket-sized: the JCM 5700 CarryScope from Jeol
