Precitec Optronik of Rodgau, Germany, has appointed Armstrong Optical to supply its range of 3D surface profiling systems and sensors for thickness measurement in the UK.
Precitec Optronik's range of sensor systems utilise the chromatic confocal technique for both non-contact profiling and thickness measurement.
While normally utilising white light, Precitec Optronik has extended the range of measurements available by introducing near-IR light sources.
This allows the thickness of materials such as silicon and gallium arsenide (commonly used as semiconductor substrates) to be easily measured.
The sensor systems are available as either OEM units that can be integrated into machine tools to measure such features as glass thickness and shape, or as standalone 3D measuring instruments for off-line topographic and measurement studies.
