Agar Scientific's universal tin-on-carbon resolution test specimen has been developed to enable resolution checks to be carried out under all operating conditions.
Many modern SEMs are operated over a wide range of accelerating voltages and working distances.
Changing operating parameters may significantly alter the ultimate resolution performance.
The wide size range of tin spheres, 3nm-30um and subsequent inter-sphere spacing, allows resolution and performance checking to be carried out over the full operating range.
The largest spheres can be used for basic column alignment at low magnification.
Intermediate sized spheres are useful for monitoring image shift when changing kV, or resolution checking at low kV.
The smallest spheres can be used for resolution assessment and astigmatism correction at the very highest magnifications.
The specimen is available on three thicknesses of substrate 2mm, 0.5mm or 0.2mm.
As with all Agar specimens, this can be supplied unmounted or on any stub.
